19.6.3 Inspection Systems and Techniques

KLA Tencor,
2007.
WWW Version. Vendor, Inspection. Semiconductor wafer inspection systems. Other industrial systems.

National Instruments,
2007.
WWW Version. Vendor, Inspection. Industrial inspection systems.

Vitronic,
1984
WWW Version. Vendor, Inspection. Vendor, 3-D Modeling. Industrial inspection systems, 3d Models, OCR, etc.

Basler Vision Technologies,
1988
WWW Version. Vendor, Inspection. Industrial inspection systems.

NeuroCheck GmbH,
1993
WWW Version. Vendor, Inspection. Industrial inspection systems.

Uno, T., Ejiri, M., Tokunaga, T.,
A method of real-time recognition of moving objects and its application,
PR(8), No. 4, October 1976, pp. 201-208.
WWW Version. 0309An object moving in the horizontal scan direction. applied as an electronic eye to a bolting robot. BibRef

Kittler, J.V., Pau, L.F.,
Automatic inspection by lots in the presence of classification errors,
PR(12), No. 4, 1980, pp. 237-241.
WWW Version. 0309 BibRef

Woods, P.W.,
The Use of Geometric and Grey-Level Models for Industrial Inspection,
PRL(5), 1987, pp. 11-17. BibRef 8700

Trivedi, M.M., Chen, C.X., and Marapane, S.B.,
A Vision System for Robotic Inspection and Manipulation,
Computer(22), No. 6, June 1989, pp. 91-97. BibRef 8906
Earlier:
ROBOSIGHT: Robotic Vision System for Inspection and Manipulation,
SPIE(1008), Expert Robots for Industrial Use, Cambridge, MA, November 1988. See also Region-Based Stereo Analysis for Robotic Applications. BibRef

Chen, C., Trivedi, M.M., and Bidlack, C.R.,
Design and Implementation of an Autonomous Spill Cleaning Robotic System,
SPIE(1293), Applications of Artificial Intelligence VIII, Orlando, FL, April 1990, pp. 691-703. BibRef 9004

Perkins, W.,
Using Circular Symmetry and Intensity Profiles for Computer Vision Inspection,
CGIP(17), No. 2, October 1981, pp. 161-172.
WWW Version. BibRef 8110

Perkins, W.A.,
INSPECTOR: A Computer Vision System That Learns to Inspect Parts,
PAMI(5), No. 6, November 1983, pp. 584-592. Model of part - inspection regions and tests. Transform the images, search for the best match (transformation). Then look for differences in the intensity or edginess. See also Model-Based Vision System for Industrial Parts, A. BibRef 8311

Baird, M.L.,
GAGESIGHT: A Computer Vision System for Automatic Inspection of Instrument Gauges,
PAMI(5), No. 6, November 1983, pp. 618-621. Gauge inspection, integrated into production. A model for each gauge, a "GM" style research and development project. BibRef 8311

Baird, M.L.,
Image Segmentation Technique for Locating Automotive Parts on Belt Conveyors,
IJCAI77(694-695). BibRef 7700

Dyer, C.R.,
Gauge Inspection Using Hough Transforms,
PAMI(5), No. 6, November 1983, pp. 621-623. Hough. Gauge inspection using Hough techniques - for checking accuracy of the gauge readings. BibRef 8311

Darwish, A.M., and Jain, A.K.,
A Rule Based Approach for Visual Pattern Inspection,
PAMI(10), No. 1, January 1988, pp. 56-68.
IEEE Abstract. IEEE Top Reference.
WWW Version. BibRef 8801

Malloch, C.B., Kwak, W.I., Gerhardt, L.A.,
A Class of Adaptive Model- and Object-Driven Nonuniform Sampling Methods for 3-D Inspection,
MVA(1), 1988, pp. 97-114. BibRef 8800

Mirmehdi, M.,
Product Label Inspection Using Transputers,
CPE(3), No. 4, 1991, pp. 265-273. Hough, Parallel.
WWW Version. BibRef 9100

Abidi, M.A.[Mongi A.], Eason, R.O.[Richard O.], Gonzalez, R.C.[Rafael C.],
Autonomous Robotic Inspection and Manipulation Using Multisensor Feedback,
Computer(24), No. 3, March 1991, pp. 14-21. Vision, touch, etc. BibRef 9103

Mecocci, A.[Allessandro],
PC-based system for transparent fluid film monitoring,
IVC(9), No. 2, April 1991, pp. 100-106.
WWW Version. 0401mpurities in transparent fluid films. BibRef

Sun, Y.N., Tsai, C.T.,
A New Model-Based Approach for Industrial Visual Inspection,
PR(25), No. 11, November 1992, pp. 1327-1336.
WWW Version. BibRef 9211

Sin, S.K., Chen, C.H.,
A comparison of deconvolution techniques for the ultrasonic nondestructive evaluation of materials,
IP(1), No. 1, January 1992, pp. 3-10.
WWW Version. 0402 BibRef

Smyth, P.[Padhraic],
Hidden Markov models for fault detection in dynamic systems,
PR(27), No. 1, January 1994, pp. 149-164.
WWW Version. 0401 BibRef

Asundi, A., Sajan, M.R.,
Peripheral Inspection of Objects,
OptLas(22), No. 3, 1995, pp. 227-240. BibRef 9500

Tarbox, G.H., Gottschlich, S.N.,
IVIS: An Integrated Volumetric Inspection System,
CVIU(61), No. 3, May 1995, pp. 430-444.
WWW Version. BibRef 9505

Tretter, D., Bouman, C.A., Khawaja, K.W., Maciejewski, A.A.,
A multiscale stochastic image model for automated inspection,
IP(4), No. 12, December 1995, pp. 1641-1654.
WWW Version. 0402 BibRef

Sobh, T., Owen, J.,
A Sensing Strategy for the Reverse Engineering of Machined Parts,
JIRS(14), No. 3, November 1995, pp. 323-340. BibRef 9511

Savary, G., Cans, M., Bastian, F.L.,
Characterization of Optical, Electronic and Topographic Images in Fatigue Research,
IVC(13), No. 8, October 1995, pp. 609-622.
WWW Version. BibRef 9510

Hunter, J.J., Graham, J., Taylor, C.J.,
User Programmable Visual Inspection,
IVC(13), No. 8, October 1995, pp. 623-628.
WWW Version. BibRef 9510

di Mauro, E.C., Cootes, T.F., Page, G.J., Jackson, C.B.,
Check: A Generic and Specific Industrial Inspection Tool,
VISP(143), No. 4, August 1996, pp. 241-249. 9611 BibRef

Mukherjee, D.P.[Dipti Prasad], Pal, A.[Amita], Sarma, S.E.[S. Eswara], Majumder, D.D.[D. Dutta],
Water quality analysis: A pattern recognition approach,
PR(28), No. 2, February 1995, pp. 269-281.
WWW Version. 0401 BibRef

Ouslim, M., Curtis, K.M.,
Automatic Visual Inspection Based upon a Variant of the N-Tuple Technique,
VISP(143), No. 5, October 1996, pp. 301-309. 9701 BibRef

Valle, M., Raffo, L., Caviglia, D.D., Bisio, G.M.,
A VLSI Image-Processing Architecture Dedicated to Real-Time Quality-Control Analysis in an Industrial-Plant,
RealTimeImg(2), No. 6, December 1996, pp. 361-371. 9702 BibRef

Simon, S., Rogala, J.P.,
Model-Based Prediction-Verification Scheme for Real-Time Inspection,
PRL(7), 1988, pp. 305-311. BibRef 8800

Griffin, P.M., Villalobos, J.R.,
Process Capability of Automated Visual Inspection Systems,
SMC(22), 1992, pp. 441-448. BibRef 9200

Skinner, D.R., Benke, K.K., Chung, M.J.,
Application of Adaptive Convolution Masking to the Automation of Visual Inspection,
RA(6), 1990, pp. 123-127. BibRef 9000

Menq, C.H., Yau, H.T., Lai, G.Y.,
Automated Precision Measurement of Surface Profile in CAD-Directed Inspection,
RA(8), 1992, pp. 268-278. BibRef 9200

Magee, M.[Michael], Weniger, R.[Richard], Wenzel, D.[Dennis],
Multidimensional pattern classification of bottles using diffuse and specular illumination,
PR(26), No. 11, November 1993, pp. 1639-1654.
WWW Version. 0401 BibRef

Tascini, G., Zingaretti, P., Conte, G.,
Real-Time Inspection by Submarine Images,
JEI(5), No. 4, October 1996, pp. 432-442. 9709 BibRef

Hou, T.H., Kuo, W.L.,
A New Edge-Detection Method for Automatic Visual Inspection,
IJAMT(13), No. 6, 1997, pp. 407-412. 9708 BibRef

Marokkey, S.R., Tay, C.J., Shang, H.M., Asundi, A.K.,
Time-Delay and Integration Imaging for Inspection and Profilometry of Moving-Objects,
OptEng(36), No. 9, September 1997, pp. 2573-2578. 9710 BibRef

Noble, J.A., Gupta, R., Mundy, J.L., Schmitz, A., Hartley, R.I.,
High-Precision X-Ray Stereo for Automated 3-D Cad-Based Inspection,
RA(14), No. 2, April 1998, pp. 292-302. 9804 BibRef

Mcaulay, A.D., Wang, J.Q.,
Optical Diffraction Inspection of Periodic Structures Using Neural Networks,
OptEng(37), No. 3, March 1998, pp. 884-888. 9804 BibRef

Hamad, D., Betrouni, M., Biela, P., Postaire, J.G.,
Neural Networks Inspection System for Glass Bottles Production: A Comparative-Study,
PRAI(12), No. 4, June 1998, pp. 505-516. 9808 BibRef

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
An Accurate and Fast Pattern Localization Algorithm for Automated Visual Inspection,
RealTimeImg(5), No. 1, February 1999, pp. 3-14. BibRef 9902

Lai, S.H.[Shang-Hong], Fang, M.[Ming],
A Hybrid Image Alignment System for Fast and Precise Pattern Localization,
RealTimeImg(8), No. 1, February 2002, pp. 23-33.
WWW Version. 0204 BibRef

Sezgin, M.[Mehmet], Taaltín, R.[Ramazan],
A new dichotomization technique to multilevel thresholding devoted to inspection applications,
PRL(21), No. 2, February 2000, pp. 151-161. 0003 BibRef

Bergasa, L.M., Duffy, N., Lacey, G., Mazo, M.,
Industrial inspection using Gaussian functions in a colour space,
IVC(18), No. 12, September 2000, pp. 951-957.
WWW Version. 0008 BibRef

Jones, D.I.,
Aerial inspection of overhead power lines using video: estimation of image blurring due to vehicle and camera motion,
VISP(147), No. 2, April 2000, pp. 157. 0005 BibRef

Marques, J.S.[Jorge S.], Jorge, P.M.[Pedro M.],
Visual inspection of a combustion process in a thermoelectric plant,
SP(80), No. 8, August 2000, pp. 1577-1589. 0008 BibRef

Paping, M.[Martin], Oskar, M.[Meier],
Device for examining securities,
US_Patent6,257,389, July 10, 2001.
WWW Version. BibRef 0107

Sari-Sarraf, H.[Hamed], Goddard Jr., J.S.[James S.], Abidi, B.R.[Besma R.], Hunt, M.A.[Martin A.],
Vision system for on-line characterization of paper slurry,
IJIST(11), No. 4, 2001, pp. 231-242.
WWW Version. 0105 BibRef

Norgard, J.[John], Will, J.[John], Stubenrauch, C.[Carl],
Quantitative images of antenna patterns using infrared thermography and microwave holography,
IJIST(11), No. 4, 2001, pp. 210-218.
WWW Version. 0105 BibRef

Ryan, C.G.,
Quantitative trace element imaging using PIXE and the nuclear microprobe,
IJIST(11), No. 4, 2001, pp. 219-230.
WWW Version. 0105 BibRef

Daut, D.G., Zhao, D.[Dongming],
A flaw detection method based on morphological image processing,
CirSysVideo(3), No. 6, December 1993, pp. 389-398.
IEEE Top Reference. 0206 BibRef

Doignon, C.[Christophe], Knittel, D.[Dominique],
Detection of Noncircularity and Eccentricity of a Rolling Winder by Artificial Vision,
JASP(2002), No. 7, July 2002, pp. 714-727. 0208 BibRef

Golightly, I.[Ian], Jones, D.[Dewi],
Corner detection and matching for visual tracking during power line inspection,
IVC(21), No. 9, September 2003, pp. 827-840.
WWW Version. 0308 BibRef

Prieto, F.[Flavio], Lepage, R.[Richard], Boulanger, P.[Pierre], Redarce, T.[Tanneguy],
A CAD-based 3D data acquisition strategy for inspection,
MVA(15), No. 2, December 2003, pp. 76-91.
WWW Version. 0401 BibRef
Earlier: A1, A4, A3, A2:
CAD-based range sensor placement for optimum 3D data acquisition,
3DIM99(128-137).
WWW Version. 9910 BibRef

Prieto, F., Redarce, T., Boulanger, P., Lepage, R.,
Tolerance control with high resolution 3D measurements,
3DIM01(339-346).
WWW Version. 0106 BibRef

Hernández, J.[Jorge], Prieto, F.[Flavio],
3D and Texture Modelling of Precolombian Objects,
ISVC06(I: 822-830).
WWW Version. 0611 BibRef

Guo, H.[Hong], Jack, L.B., Nandi, A.K.,
Feature generation using genetic programming with application to fault classification,
SMC-B(35), No. 1, February 2005, pp. 89-99.
IEEE Abstract. IEEE Top Reference. 0501 BibRef

Elbehiery, H.M.[Hussam M.], Hefnawy, A.A.[Alaa A.], Elewa, M.T.[Muhammad T.],
Visual Inspection for Fired Ceramic Tile's Surface Defects Using Wavelet Analysis,
GVIP(05), No. V2, January 2005, pp. 1-8
HTML Version. BibRef 0501

Evans, J.P.O., Liu, Y., Chan, J.W., Downes, D.,
View synthesis for depth from motion 3D X-ray imaging,
PRL(27), No. 15, November 2006, pp. 1863-1873.
WWW Version. 0609Security X-ray; Image synthesis; KDE; Kinetic depth; Stereoscopic; Correspondence problem; Multiple view BibRef

Grafulla-González, B.[Beatriz], Lebart, K.[Katia], Harvey, A.R.[Andrew R.],
Physical optics modelling of millimetre-wave personnel scanners,
PRL(27), No. 15, November 2006, pp. 1852-1862.
WWW Version. 0609Millimetre-wave; Image formation; Image simulation; Kolmogorov-Smirnov test; Material classification BibRef

Vitri, J., Bressan, M., Radeva, P.I.,
Bayesian Classification of Cork Stoppers Using Class-Conditional Independent Component Analysis,
SMC-C(37), No. 1, January 2007, pp. 32-38.
WWW Version. 0701 BibRef

Nakamae, K.[Koji], Chikahisa, M.[Masaki], Fujioka, H.[Hiromu],
Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection,
IVC(25), No. 7, 1 July 2007, pp. 1117-1123.
WWW Version. 0705Wavelet multiresolution analysis; SEM image; Probe profile estimation; Electron probe; Inline SEM inspection BibRef

Iravani-Tabrizipour, M.[Mehrdad], Toyserkani, E.[Ehsan],
An image-based feature tracking algorithm for real-time measurement of clad height,
MVA(18), No. 6, December 2007, pp. 343-354.
WWW Version. 0711In manufacturing process. Trinocular system. BibRef

Sebastián, J.M., García, D., Traslosheros, A., Sánchez, F.M., Domínguez, S., Pari, L.,
A New Approach to the Automatic Planning of Inspection of 3D Industrial Parts,
ACIVS07(25-36).
WWW Version. 0708 BibRef

Carrasco, M.[Miguel], Mery, D.[Domingo],
Automatic Multiple Visual Inspection on Non-calibrated Image Sequence with Intermediate Classifier Block,
PSIVT07(371-384).
WWW Version. 0712 BibRef
Earlier: A2, A1:
Advances on Automated Multiple View Inspection,
PSIVT06(513-522).
WWW Version. 0612 BibRef
Earlier: A2, A1:
Automated Multiple View Inspection Based on Uncalibrated Image Sequences,
SCIA05(1238-1247).
WWW Version. 0506 BibRef

Bazin, A.I., Cole, T., Kett, B., Nixon, M.S.,
An Automated System for Contact Lens Inspection,
ISVC06(I: 141-150).
WWW Version. 0611 BibRef

Martone, A.F., Mikkilineni, A.K., Delp, E.J.,
Forensics of Things,
Southwest06(149-152).
WWW Version. 0603 BibRef

van Gosliga, R., Lindenbergh, R., Pfeifer, N.,
Deformation analysis of a bored tunnel by means of terrestrial laserscanning,
IEVM06(xx-yy).
PDF Version. 0609 BibRef

Stößel, D.[Dirk], Sagerer, G.[Gerhard],
Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images,
DAGM06(597-606).
WWW Version. 0610 BibRef

Zhang, J.[Jian], Yang, R.[Ruqing],
Insulators Recognition for 220kv/330kv High-voltage Live-line Cleaning Robot,
ICPR06(IV: 630-633).
WWW Version. 0609 BibRef

Fu, Z.Y.[Zhou-Yu], Robles-Kelly, A.[Antonio],
Learning Object Material Categories via Pairwise Discriminant Analysis,
OTCBVS07(1-7).
WWW Version. 0706 BibRef

Fu, Z.Y.[Zhou-Yu], Robles-Kelly, A.[Antonio], Tan, R.T.[Robby T.], Caelli, T.M.[Terry M.],
Invariant Object Material Identification via Discriminant Learning on Absorption Features,
OTCBVS06(140).
WWW Version. 0609 BibRef

Moalla, I., Alimi, A.M., Le Bourgeois, F., Emptoz, H.,
Image Analysis for Palaeography Inspection,
DIAL06(303-311).
WWW Version. 0604 BibRef

Zhu, Z.G.[Zhi-Gang], Hu, Y.C.[Yu-Chi],
Stereo Matching and 3D Visualization for Gamma-Ray Cargo Inspection,
WACV07(13-13).
WWW Version. 0702 BibRef

Zhu, Z.G.[Zhi-Gang], Zhao, L.[Li], Lei, J.[Jiayan],
3D Measurements in Cargo Inspection with a Gamma-Ray Linear Pushbroom Stereo System,
SafeSecur05(III: 126-126).
WWW Version. 0507 BibRef

Ghosh, D., Wei, D.C.T.[David C. Tou],
Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs,
ACCV06(II:623-632).
WWW Version. 0601 BibRef

Li, X., Fang, Z.P., Ng, F.L., Zhao, L.P., Zhao, L.,
Inspection and Image Analysis of Nickel Sulphide Inclusions in Toughened Glass Panels,
ICARCV06(1-6).
WWW Version. 0612 BibRef

Lins, R.D.[Rafael Dueire], Oliveira, D.M.[Daniel Marques],
Automatically Detecting Symmetries in Decorative Tiles,
ICIAR05(310-319).
WWW Version. 0509 BibRef

Lins, R.D.[Rafael Dueire],
A New File Format for Decorative Tiles,
ICIAR04(II: 175-182).
WWW Version. 0409 BibRef

Xie, J.[Jin], Kaya, A., Bain, J.A., Vijaya Kumar, B.V.K.,
Shallow Arc Detection in Disk Surface Images for Disk Forensics,
ICIP05(III: 81-84).
WWW Version. 0512 BibRef

Cuenca, S.A.[Sergio A.], Cámara, A.[Antonio], Suardíaz, J.[Juan], Toledo, A.[Ana],
Domain-Specific Codesign for Automated Visual Inspection Systems,
IbPRIA05(I:683).
WWW Version. 0509 BibRef

Mery, D.[Domingo], Medina, O.[Olaya],
Automated Visual Inspection of Glass Bottles Using Adapted Median Filtering,
ICIAR04(II: 818-825).
WWW Version. 0409 BibRef

Duan, F.[Feng], Wang, Y.N.[Yao-Nan], Liu, H.J.[Huan-Jun],
A real-time machine vision system for bottle finish inspection,
ICARCV04(II: 842-846).
WWW Version. 0412 BibRef

Martín-Herrero, J., Ferreiro-Armán, M., Alba-Castro, J.L.,
Grading Textured Surfaces with Automated Soft Clustering in a Supervised SOM,
ICIAR04(II: 323-330).
WWW Version. 0409 BibRef
And:
A SOFM improves a real time quality assurance machine vision system,
ICPR04(IV: 301-304).
WWW Version. 0409 BibRef

Behnke, S.,
A two-stage system for meter value recognition,
ICIP03(I: 549-552).
IEEE Abstract. IEEE Top Reference. 0312 BibRef

von Bank, C.[Clemens], Gavrila, D.M.[Dariu M.], Wöhler, C.[Christian],
A Visual Quality Inspection System Based on a Hierarchical 3D Pose Estimation Algorithm,
DAGM03(179-186).
HTML Version. 0310 BibRef

Ding, Y.H.[Yu-Hua], Vachtsevanos, G.J.[George J.], Yezzi, A.J.[Anthony J.], Daley, W.[Wayne], Heck-Ferri, B.S.[Bonnie S.],
A Real-Time Multisensory Image Segmentation Algorithm with an Application to Visual and X-Ray Inspection,
CVS03(192 ff).
HTML Version. 0306 BibRef

Zitova, B., Flusser, J., Sroubek, F.,
Application of image processing for the conservation of the medieval mosaic,
ICIP02(III: 993-996).
IEEE Abstract. IEEE Top Reference. 0210 BibRef

Toth, D., Aach, T.,
Improved minimum distance classification with Gaussian outlier detection for industrial inspection,
CIAP01(584-588).
IEEE Top Reference. 0210 BibRef

Samek, O.[Ota], Krzysánek, V.[Vladislav], Beddows, D.C.S.[David C.S.], Telle, H.H.[Helmut H.], Kaiser, J.[Josef], Lika, M.[Miroslav],
Material Identification Using Laser Spectroscopy and Pattern Recognition Algorithms,
CAIP01(443 ff.).
HTML Version. 0210 BibRef

Hutterer, A., Menzel, T., Otto, A., Müller, G.,
Feature Extraction for Advanced Control of Flexible Forming Processes,
VMV01(xx-yy).
PDF Version. 0209 BibRef

Köppen, M., Soria-Frisch, A., Sy, T.,
Binary Pattern Processing Framework for Perceptual Fault detection,
SCIA01(P-W4B). 0206 BibRef

Chen, C., Qiu, G.,
Detection Algorithm of Particle Contamination in Reticle Images with Continuous Wavelet Transform,
BMVC01(Poster Session 2. and Demonstrations).
HTML Version. The University of Nottingham 0110 BibRef

Honda, T.[Toshifumi], Nayar, S.K.[Shree K.],
Finding 'Anomalies' in an Arbitrary Image,
ICCV01(II: 516-523).
WWW Version. 0106 Structural Texture. I.e. where the texture is interrupted (e.g. generic inspection). BibRef

Shu, C., Xi, F.,
Model-based scanning path generation for inspection,
3DIM99(118-124).
WWW Version. 9910 BibRef

Sablatnig, R., Kropatsch, W.G.,
Application constraints in the design of an automatic reading device for analog display instruments,
WACV94(205-212).
IEEE Abstract. IEEE Top Reference. 0403 BibRef
Earlier:
Automatic reading of analog display instruments,
ICPR94(A:794-797).
WWW Version. 9410 BibRef

Chou, P.C., Bennamoun, M.,
Accurate Localization of Edges in Noisy Volume Images,
ICPR00(Vol IV: 760-763).
WWW Version.
HTML Version. 0009Inspection. BibRef

Abegg, F., Engel, D., Wörn, H.,
A Robust Algorithm for Segmenting Deformable Linear Objects from Video Image Sequences,
ICPR00(Vol IV: 756-759).
WWW Version.
HTML Version. 0009 BibRef

Abegg, F., Wörn, H.,
Robust Algorithms for Recognizing Shape Changes of Deformable Linear Objects in Video Image Sequences,
ICIP00(Vol I: 335-338).
IEEE Abstract. IEEE Top Reference. 0008 BibRef

Kita, N.,
Visual Attention Control for Nuclear Power Plant Inspection,
ICPR00(Vol IV: 118-123).
WWW Version.
HTML Version. 0009 BibRef

Kauppinen, H., Silvén, O., Piirainen, T.,
Self-Organizing Map Based User Interface for Visual Surface Inspection,
SCIA99(Industrial Applications). BibRef 9900

Ramos, V., Pina, P., Muge, F.,
From Feature Extraction to Classification: A Multidisciplinary Approach Applied to Portuguese Granites,
SCIA99(Industrial Applications). BibRef 9900

Krcmar, M., Kodl, P.,
Model Management in the System Generating Vision Inspections,
MVA98(xx-yy). BibRef 9800

Ji, Q.[Qiang], Haralick, R.M.[Robert M.],
A Statistical Framework for Geometric Tolerancing Manufactured Parts,
ICPR98(Vol II: 1728-1730).
WWW Version. 9808 BibRef

Kadyrov, A., Petrou, M.[Maria],
Linear Transformation Parameter Estimation for Fault Detection,
ICPR98(Vol I: 550-552).
WWW Version. 9808 BibRef

Nguyen, V.D.[Van-Duc], Noble, J.A.[J. Alison], Mundy, J.L.[Joseph L.], Janning, J.[John], Ross, J.[Joseph],
Exhaustive Detection of Manufacturing Flaws as Abnormalities,
CVPR98(945-952).
IEEE Abstract. IEEE Top Reference. BibRef 9800

Nagata, N.[Noriko], Dobashi, T.[Toshimasa], Manabe, Y.[Yoshitsugu], Usami, T.[Teruo], and Inokuchi, S.[Seiji],
Modelling and Visualization for Pearl Quality Evaluation Simulator,
SCIA97(xx-yy) 9705
HTML Version. BibRef

Wiklund, J., Granlund, G.H.,
Autonomous Inspection System for Nuclear Power Plants,
SSAB97(Autonomous Systems) 9703 BibRef

Nagata, N.[Noriko], Dobashi, T.[Toshimasa], Manabe, Y.[Yoshitsugu], Usami, T.[Teruo], Inokuchi, S.[Seiji],
Image analysis and synthesis using physics-based-modeling for pearl quality evaluation system,
CIAP97(II: 697-704).
WWW Version. 9709 BibRef

Boddeke, F., Schenkeveld, E., van Geest, L., Young, I.,
Fluorescence Lifetime Determination for Application in Microscopy,
ICPR96(III: 854-858).
WWW Version. 9608(Delft Univ. of Technology, NL) BibRef

Aas, K., Eikvil, L., Milvang, O.,
Automatic Can Separation,
ICPR96(III: 954-958).
WWW Version. 9608(Norwegian Computing Center, N) BibRef

Sablatnig, R.,
Flexible Automatic Visual Inspection Based on the Separation of Detection And Analysis,
ICPR96(III: 944-948).
WWW Version. 9608(Technical Univ. Vienna, A) BibRef

Pascoletti, A., and Trucco, E.,
On Uncalibrated Motion-Based Inspection for Conveyor-Belt Systems,
BMVC96(Poster Session 2). 9608Universita di Udine and Heriot-Watt University BibRef

Boukouvalas, C., Kittler, J.V., Marik, R., Petrou, M.,
Automatic Grading of Textured Ceramic Tiles,
SPIE(2425), 3rd Machine Vision Applications in Industrial Inspection, February 1995, San Jose, pp. 248-256. BibRef 9502

Anzalone, A., Machi, A.,
Real-Time Visual Inspection of Moulded Plastics Drippers,
CAMP95(xx). BibRef 9500

Bartels, K.A., Fisher, J.L.,
Multifrequency eddy current image processing techniques for nondestructive evaluation,
ICIP95(I: 486-489).
WWW Version. 9510 BibRef

Brzakovic, D., Vujovic, N.,
Development environment for designing and testing inspection systems,
ICPR94(C:366-369).
WWW Version. 9410 BibRef

Hartley, R.I.[Richard I.], Noble, J.A.[J. Alison], Grande, J.[James], Liu, J.[Jane],
Quantitative measurement of manufactured diamond shape,
ECCV94(A:433-440).
WWW Version. 9405 BibRef

Sobh, T.M., Dekhil, M., Jaynes, C., and Henderson, T.C.,
A Perception Framework for Inspection and Reverse Engineering,
CVPR93(609-610).
IEEE Abstract. IEEE Top Reference. BibRef 9300

Mundy, J.L., and Noble, J.A.,
Toward Template-Based Tolerancing from a Bayesian Viewpoint,
CVPR93(246-252).
IEEE Abstract. IEEE Top Reference. Inspection based on templates. BibRef 9300

Noble, J.A., Nguyen, V.D., Marinos, C., Tran, A.T., Farley, J., Hedengren, K., and Mundy, J.L.,
Template Guided Visual Inspection,
ECCV92(893-901).
WWW Version. BibRef 9200

Mundy, J.L., Noble, J.A., Marinos, C., Nguyen, V.D., Heller, A.J., Farley, J., and Tran, A.T.,
An Object-Oriented Approach to Template Guided Inspection,
CVPR92(386-392).
IEEE Abstract. IEEE Top Reference. Systems design issues for inspection techniques. BibRef 9200

Palenichka, R.M.[Roman M.], Mysak, R.T.[Roman T.],
Model-based adaptive preprocessing of images in automatic visual inspection,
CAIP93(732-737).
WWW Version. 9309 BibRef

Boccignone, G., Esposito, L., Marcelli, A.,
An experimental vision tool for real time quality control,
CAIP93(706-710).
WWW Version. 9309 BibRef

Modayur, B.R., Shapiro, L.G.,
Automated Inspection Of Machine Parts,
ICPR92(I:57-60).
WWW Version. BibRef 9200

Nayar, S.K.,
Shape recovery methods for visual inspection,
WACV92(136-145).
IEEE Abstract. IEEE Top Reference. 0403 BibRef

Avnaim, F., Boissonnat, J.D.,
A geometric approach to inspection,
ICPR88(II: 891-893).
WWW Version. 8811 BibRef

Brun-Buisson, A., Lattuati, V., Lemoine, D.,
Selective Sorting of Glass Bottles by Artificial Vision,
ICPR86(759-761). BibRef 8600

Firschein, O., Fischler, M.A.,
Perceptual Problems in Analyzing Industrial Radiographs,
IJCAI81(740-745). BibRef 8100

Barnard, S.T.[Stephen T.],
Automated Inspection Using Gray-Scale Statistics,
AAAI-80(49-52). BibRef 8000
And: ICPR80(269-272). BibRef

Peterson, C.,
Automated Visual Inspection,
ICPR74(). BibRef 7400

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection Systems -- General, Survey, Review .