19.6.3.8 Inspection -- Defect Detection, Crack Detection

Avalon Vision Solutions,
1991.
WWW Version. Vendor, Inspection. Industrial inspection systems.

Ejiri, M., Uno, T., Mese, M., Ikeda, T.,
A Process for Detecting Defects in Complicated Patterns,
CGIP(2), 1973, pp. 326-339. BibRef 7300

Maitre, H.[Henri],
Defect recognition in numerical images by spectrum zero detection,
CGIP(5), No. 2, June 1976, pp. 238-244.
WWW Version. 0501
BibRef

Woods, P.W.[Peter W.], Allen, P.D.,
A cue generator for crack detection,
IVC(7), No. 4, November 1989, pp. 268-273.
WWW Version. 0401
BibRef

Gmytrasiewicz, P., Hassberger, J.A., Lee, J.C.,
Fault tree based diagnostics using fuzzy logic,
PAMI(12), No. 11, November 1990, pp. 1115-1119.
IEEE Abstract.
IEEE DOI Link 0401
BibRef

Leu, J.G.[Jia-Guu], Yau, H.L.[Hok-Lai],
Detecting the dislocations in metal crystals from microscopic images,
PR(24), No. 1, 1991, pp. 41-56.
WWW Version. 0401
BibRef

Perner, P.[Petra],
A Knowledge-Based Image-Inspection System for Automatic Defect Recognition, Classification, and Process Diagnosis,
MVA(7), No. 3, 1994, pp. 135-147. BibRef 9400
Earlier:
Application of knowledge-based image inspection system for diagnosis of misprints in offsetprinting,
CAIP93(738-749).
Springer DOI Link 9309
BibRef

Bryson, N., Dixon, R.N., Hunter, J.J., Taylor, C.J.,
Contextual Classification of Cracks,
IVC(12), No. 3, April 1994, pp. 149-154.
WWW Version. BibRef 9404
Earlier: BMVC93(xx).
PDF Version. BibRef

Azencott, R., Chalmond, B., Coldefy, F.,
Markov Fusion of a Pair of Noisy Images to Detect Intensity Valleys,
IJCV(16), No. 2, October 1995, pp. 135-145.
Springer DOI Link Cracks. Task is to detect defects using pairs of radiographic images. Defects are identified as intensity valleys. BibRef 9510

Kona, S.R.[Sudheer R.], Foster, J.W.[Joseph W.], Varughese, J.V.[Joseph V.],
A robust algorithm for detecting pinholes in transparent plastic films,
PR(26), No. 8, August 1993, pp. 1215-1227.
WWW Version. 0401
BibRef

Asaeda, T.[Teruo], Nousou, K.[Kazunori], Imanisi, M.[Masanori], Suzuki, Y.[Yutaka], Katabami, S.[Sachiyo],
Inspection system and process,
US_Patent5,734,742, Mar 31, 1998
WWW Version. BibRef 9803

Nesi, P.[Paolo], Trucco, E.[Emanuel],
Guest Editorial: Special Issue on Real-Time Defect Detection,
RealTimeImg(5), No. 1, February 1999, pp. 1-2. BibRef 9902

Latif-Amet, A., Ertüzün, A., Erçil, A.,
An Efficient Method for Texture Defect Detection: Sub-Band Domain Co-Occurrence Matrices,
IVC(18), No. 6-7, 1 May 2000, pp. 543-553.
WWW Version. 0003
BibRef

Baykut, A.[Alper], Atalay, A.[Alper], Erçil, A.[Aytül], Güler, M.[Mustafa],
Real-time Defect Inspection of Textured Surfaces,
RealTimeImg(6), No. 1, February 2000, pp. 17-27. 0003
BibRef

Zabih, R.[Ramin], Halviatti, R.[Ramin],
Method and apparatus for analyzing computer screens,
US_Patent6,226,407, May 1, 2001
WWW Version. BibRef 0105

Kazantsev, I.G., Lemahieu, I., Salov, G.I., Denys, R.,
Statistical detection of defects in radiographic images in nondestructive testing,
SP(82), No. 5, May 2002, pp. 791-801.
HTML Version. 0206
BibRef

Plantier, J.[Justin], Boutté, L.[Laurent], Lelandais, S.[Sylvie],
Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation,
JASP(2002), No. 7, July 2002, pp. 659-666. 0208
BibRef

Kumar, A., Pang, G.K.H.,
Defect detection in textured materials using optimized filters,
SMC-B(32), No. 5, October 2002, pp. 553-570.
IEEE Top Reference. 0210
BibRef

Tsai, D.M.[Du-Ming], Tsai, Y.H.[Ya-Hui],
Defect detection in textured surfaces using color ring-projection correlation,
MVA(13), No. 4, 2003, pp. 194-200.
HTML Version. 0304
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta],
Fast normalized cross correlation for defect detection,
PRL(24), No. 15, November 2003, pp. 2625-2631.
WWW Version. 0308
BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta], Chen, J.F.[Jeng-Fung],
The evaluation of normalized cross correlations for defect detection,
PRL(24), No. 15, November 2003, pp. 2525-2535.
WWW Version. 0308
BibRef

Tsai, D.M.[Du-Ming], Kuo, C.C.[Chih-Chia],
Defect Detection in Inhomogeneously Textured Sputtered Surfaces Using 3D Fourier Image Reconstruction,
MVA(18), No. 6, December 2007, pp. 383-400.
Springer DOI Link 0711
BibRef

Vachtesvanos, G.J.[George J.], Dorrity, L.J.[Lewis J.], Wang, P.[Peng], Echauz, J.[Javier], Mufti, M.[Muid],
Method and apparatus for analyzing an image to detect and identify patterns,
US_Patent6,650,779, Nov 18, 2003
WWW Version. BibRef 0311

Lam, E.Y.[Edmund Y.],
Robust minimization of lighting variation for real-time defect detection,
RealTimeImg(10), No. 6, December 2004, pp. 365-370.
WWW Version. 0501
BibRef

Tsai, D.M.[Du-Ming], Chao, S.M.[Shin-Min],
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,
IVC(23), No. 3, 1 March 2005, pp. 325-338.
WWW Version. 0501
BibRef

Li, W.C.[Wei-Chen], Tsai, D.M.[Du-Ming],
Wavelet-based defect detection in solar wafer images with inhomogeneous texture,
PR(45), No. 2, February 2012, pp. 742-756.
Elsevier DOI Link
WWW Version. 1110
Surface inspection; Defect detection; inhomogeneous texture; Solar wafer; Wavelet transform BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
An improved anisotropic diffusion model for detail- and edge-preserving smoothing,
PRL(31), No. 13, 1 October 2010, pp. 2012-2023.
Elsevier DOI Link
WWW Version. 1003
Edge-preserving smoothing; Image restoration; Image denoising; Anisotropic diffusion BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images,
PR(43), No. 5, May 2010, pp. 1917-1931.
Elsevier DOI Link
WWW Version. 1003
Defect detection; Surface inspection; Anisotropic diffusion; Entropy criterion; Particle swarm optimization BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming], Chiu, W.Y.[Wei-Yao], Li, W.C.[Wei-Chen],
Anisotropic diffusion-based detail-preserving smoothing for image restoration,
ICIP10(4145-4148).
IEEE DOI Link 1009
BibRef
And: A1, A2, A4, A3:
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces,
ICPR10(4408-4411).
IEEE DOI Link 1008
BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
An anisotropic diffusion-based defect detection for low-contrast glass substrates,
IVC(26), No. 2, 1 February 2008, pp. 187-200.
WWW Version. 0711
Defect detection; Surface inspection; Anisotropic diffusion; Low-contrast images; Glass substrates BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Jhang, Y.R.[Yuan-Ruei],
Defect detection in low-contrast glass substrates using anisotropic diffusion,
ICPR06(I: 654-657).
IEEE DOI Link 0609
BibRef

Kalliomäki, I.[Ilkka], Vehtari, A.[Aki], Lampinen, J.[Jouko],
Shape analysis of concrete aggregates for statistical quality modeling,
MVA(16), No. 3, May 2005, pp. 197-201.
Springer DOI Link 0505
BibRef

Ribeiro, B.,
Support vector machines for quality monitoring in a plastic injection molding process,
SMC-C(35), No. 3, August 2005, pp. 401-410.
IEEE DOI Link 0508
BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Takagi, Y.[Yuji], Okuda, H.[Hirohito],
Successive pattern classification based on test feature classifier and its application to defect image classification,
PR(38), No. 11, November 2005, pp. 1847-1856.
WWW Version. 0509
BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Tanaka, T.,
Successive pattern learning based on test feature classifier and its application to dynamic recognition problems,
IEVM06(xx-yy).
PDF Version. 0609
BibRef

Tsai, D.M.[Du-Ming], Yang, C.H.[Cheng-Hsiang],
A quantile-quantile plot based pattern matching for defect detection,
PRL(26), No. 13, 1 October 2005, pp. 1948-1962.
WWW Version. 0509
BibRef

Tsai, D.M.[Du-Ming], Yang, R.H.[Ron-Hwa],
An eigenvalue-based similarity measure and its application in defect detection,
IVC(23), No. 12, 1 November 2005, pp. 1094-1101.
WWW Version. 0510
BibRef

Liu, J.J.[J. Jay], MacGregor, J.F.[John F.],
Estimation and monitoring of product aesthetics: Application to manufacturing of 'engineered stone' countertops,
MVA(16), No. 6, 2006, pp. 374-383.
Springer DOI Link 0603
BibRef

Taniguchi, K.[Kazutaka], Ueta, K.[Kunio], Tatsumi, S.[Shoji],
A mura detection method,
PR(39), No. 6, June 2006, pp. 1044-1052.
WWW Version. 0604
Mura (irregular lightness variation on a manufactured surface); Defect; Detection; Vision; Spatial frequency; Contrast enhancement BibRef

Tsai, D.M.[Du-Ming], Lin, P.C.[Ping-Chieh], Lu, C.J.[Chi-Jie],
An independent component analysis-based filter design for defect detection in low-contrast surface images,
PR(39), No. 9, September 2006, pp. 1679-1694.
WWW Version. 0606
Surface inspection; Independent component analysis; Convolution filter; Particle swarm optimization BibRef

Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Chao, S.M.[Shin-Min], Yen, C.H.[Chao-Hsuan],
Independent component analysis based filter design for defect detection in low-contrast textured images,
ICPR06(II: 231-234).
IEEE DOI Link 0609
BibRef

Lu, C.J.[Chi-Jie], Tsai, D.M.[Du-Ming],
Independent component analysis-based defect detection in patterned liquid crystal display surfaces,
IVC(26), No. 7, 2 July 2008, pp. 955-970.
WWW Version. 0804
Defect detection; Surface inspection; TFT-LCD panels; Independent component analysis BibRef

Tsai, D.M.[Du-Ming], Lai, S.C.[Shia-Chih],
Defect detection in periodically patterned surfaces using independent component analysis,
PR(41), No. 9, September 2008, pp. 2812-2832.
WWW Version. 0806
Defect detection; Patterned surface; Independent component analysis; Particle swarm optimization; Liquid crystal display BibRef

Tsai, D.M.[Du-Ming], Chuang, S.T.[Su-Ta],
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations,
MVA(20), No. 6, October 2009, pp. xx-yy.
Springer DOI Link 0910
BibRef

Baykal, I.C.[Ibrahim Cem], Jullien, G.A.[Graham A.],
On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures,
MVA(17), No. 3, August 2006, pp. 185-195.
Springer DOI Link 0606
BibRef

Ng, H.F.[Hui-Fuang],
Automatic thresholding for defect detection,
PRL(27), No. 14, 15 October 2006, pp. 1644-1649.
WWW Version. 0609
Automatic thresholding; Defect detection BibRef

Sezer, O.G., Ercil, A., Ertuzun, A.,
Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection,
PR(40), No. 1, January 2007, pp. 121-133.
WWW Version. 0611
Human vision; Texture defect detection; Independent component analysis; Receptive fields BibRef

Tsap, L.V.[Leonid V.], Duchaineau, M.[Mark], Goldgof, D.B.[Dmitry B.], Shin, M.C.[Min C.],
Data-driven feature modeling, recognition and analysis in a discovery of supersonic cracks in multimillion-atom simulations,
PR(40), No. 9, September 2007, pp. 2400-2407.
WWW Version. 0705
Data-driven; Feature modeling (analysis, extraction, recognition); Image motion analysis; Physics-based; Supersonic cracks; Molecular dynamics; Atomic simulation; Nanoscale analysis BibRef

Caleb-Solly, P., Smith, J.E.,
Adaptive surface inspection via interactive evolution,
IVC(25), No. 7, 1 July 2007, pp. 1058-1072.
WWW Version. 0705
Machine vision; Configuration; Interative; Evolution User knowledge to get description for defects. BibRef

Xie, X.H.[Xiang-Hua], Mirmehdi, M.[Majid],
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces,
PAMI(29), No. 8, August 2007, pp. 1454-1464.
IEEE DOI Link 0707
BibRef
Earlier:
Localising Surface Defects in Random Colour Textures Using Multiscale Texem Analysis in Image Eigenchannels,
ICIP05(III: 1124-1127).
IEEE DOI Link 0512
Based on a few examples. Compare to Gabor filters. BibRef

Xie, X.H.[Xiang-Hua],
A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques,
ELCVIA(7), No. 3, 2008, pp. 1-22.
WWW Version. 0711
Survey, Defect Detection. BibRef

Groby, J.P.[Jean-Philippe], Lesselier, D.[Dominique],
Localization and characterization of simple defects in finite-sized photonic crystals,
JOSA-A(25), No. 1, January 2008, pp. 146-152.
WWW Version. 0801
BibRef

Lim, M.S.[Mee-Seub], Lim, J.H.[Joon-Hong],
Visual measurement of pile movements for the foundation work using a high-speed line-scan camera,
PR(41), No. 6, June 2008, pp. 2025-2033.
WWW Version. 0802
Line-scan image; Visual measurement; Pile movement BibRef

Hadizadeh, H.[Hadi], and Baradaran Shokouhi, S.[Shahriar],
Random Texture Defect Detection Using 1-D Hidden Markov Models Based on Local Binary Patterns,
IEICE(E91-D), No. 7, July 2008, pp. 1937-1945.
WWW Version. BibRef 0807

Choi, K.N.[Kyu Nam], Park, N.K.[No Kap], Yoo, S.I.[Suk In],
Image Restoration for Quantifying TFT-LCD Defect Levels,
IEICE(E91-D), No. 2, February 2008, pp. 322-329.
WWW Version. 0802
BibRef

Liew, C.K.[Chin Kian], Veidt, M.[Martin],
Pattern recognition of guided waves for damage evaluation in bars,
PRL(30), No. 3, 1 February 2009, pp. 321-330.
Elsevier DOI Link
WWW Version. 0804
Ultrasonics; Quantitative nondestructive evaluation; Structural health monitoring; Multi-layer perceptron; Ensemble networks; Modular networks BibRef

Suganthan, S., MacDonald, L.W.,
Correcting image defects of stained glass windows,
IJIST(18), No. 5-6, 2008, pp. 296-306.
WWW Version. 0804
BibRef

Gnanaprakasam, P.[Pradeep], Parker, J.M.[Johne M.], Ganapathiraman, S.[Subburengan], Hou, Z.[Zhen],
Efficient 3D characterization of raised topological defects in smooth specular coatings,
IVC(27), No. 4, 3 March 2009, pp. 319-330.
Elsevier DOI Link
WWW Version. 0804
Surface reflectance model; Surface quality of specular coatings; Defect characterization; Camera calibration BibRef

Kim, H.I., Lee, S.H., Cho, N.I.,
Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme,
SPLetters(16), No. 5, May 2009, pp. 374-377.
IEEE DOI Link 0903
Uses histogram of spatial orientation and frequency. BibRef

Hampel, U., Maas, H.G.,
Cascaded image analysis for dynamic crack detection in material testing,
PandRS(64), No. 4, July 2009, pp. 345-350.
Elsevier DOI Link
WWW Version. 0907
Image matching; Image analysis; Deformation measurement BibRef

Tsneg, Y.H.[Yan-Hsin], Tsai, D.M.[Du-Ming],
Defect detection of uneven brightness in low-contrast images using basis image representation,
PR(43), No. 3, March 2010, pp. 1129-1141.
Elsevier DOI Link
WWW Version. 1001
Defect detection; Surface inspection; Basis image representation; Independent component analysis; Particle swarm optimization BibRef

Yamaguchi, T.[Tomoyuki], Hashimoto, S.[Shuji],
Fast crack detection method for large-size concrete surface images using percolation-based image processing,
MVA(21), No. 5, August 2010, pp. 797-809.
WWW Version. 1011
BibRef
Earlier:
Improved percolation-based method for crack detection in concrete surface images,
ICPR08(1-4).
IEEE DOI Link 0812
BibRef

Clemmensen, L.H.[Line H.], Hansen, M.E.[Michael E.], Ersbøll, B.K.[Bjarne K.],
A comparison of dimension reduction methods with application to multi-spectral images of sand used in concrete,
MVA(21), No. 6, October 2010, pp. 959-968.
WWW Version. 1011
BibRef

Fujita, Y.[Yusuke], Hamamoto, Y.[Yoshihiko],
A robust automatic crack detection method from noisy concrete surfaces,
MVA(22), No. 2, March 2011, pp. 245-254.
WWW Version. 1103
BibRef

Tsai, D.M.[Du-Ming], Tsai, H.Y.[Hsin-Yang],
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis,
MVA(22), No. 4, July 2011, pp. 629-649.
WWW Version. 1107
BibRef

Elunai, R., Chandran, V., Gallagher, E.,
Asphalt Concrete Surfaces Macrotexture Determination From Still Images,
ITS(12), No. 3, September 2011, pp. 857-869.
IEEE DOI Link 1109
BibRef

Ndoye, M., Barker, A.M., Krogmeier, J.V., Bullock, D.M.,
A Recursive Multiscale Correlation-Averaging Algorithm for an Automated Distributed Road-Condition-Monitoring System,
ITS(12), No. 3, September 2011, pp. 795-808.
IEEE DOI Link 1109
BibRef

Burgess, G., Shortis, M.R., Scott, P.,
Photographic assessment of retroreflective film properties,
PandRS(66), No. 5, September 2011, pp. 743-750.
Elsevier DOI Link
WWW Version. 1110
Retroreflective film; Retroreflectance; Luminance factor; Standards; Performance BibRef

Li, Q.Q.[Qing-Quan], Zou, Q.[Qin], Zhang, D.Q.[Da-Qiang], Mao, Q.Z.[Qing-Zhou],
FoSA: F* Seed-growing Approach for crack-line detection from pavement images,
IVC(29), No. 12, November 2011, pp. 861-872.
Elsevier DOI Link
WWW Version. 1112
Line detection; Pavement crack; Seed-growing; Dynamic programming BibRef

Zou, Q.[Qin], Cao, Y.[Yu], Li, Q.Q.[Qing-Quan], Mao, Q.[Qingzhou], Wang, S.[Song],
CrackTree: Automatic crack detection from pavement images,
PRL(33), No. 3, 1 February 2012, pp. 227-238.
Elsevier DOI Link
WWW Version. 1201
Crack detection; Edge detection; Edge grouping; Tensor voting; Shadow removal BibRef

Satorres Martínez, S., Gómez Ortega, J., Gámez García, J., Sánchez García, A.,
A machine vision system for defect characterization on transparent parts with non-plane surfaces,
MVA(23), No. 1, January 2012, pp. 1-13.
WWW Version. 1201
BibRef

Tong, X.H.[Xu-Hang], Guo, J.[Jie], Ling, Y.[Yun], Yin, Z.P.[Zhou-Ping],
A new image-based method for concrete bridge bottom crack detection,
IASP11(568-571).
IEEE DOI Link 1112
BibRef

Yuan, X.[Xia], Zhao, C.X.[Chun-Xia], Cai, Y.F.[Yun-Fei], Zhang, H.F.[Hao-Feng], Chen, D.B.[De-Bao],
Road-surface abstraction using ladar sensing,
ICARCV08(1097-1102).
IEEE DOI Link 1109
BibRef

Zhao, J.[Jie], Kong, Q.J.[Qing-Jie], Zhao, X.[Xu], Liu, J.P.[Jia-Peng], Liu, Y.C.[Yun-Cai],
A Method for Detection and Classification of Glass Defects in Low Resolution Images,
ICIG11(642-647).
IEEE DOI Link 1109
BibRef

Liu, L.H.[Ling-Hui], Zeng, L.[Li], Bi, B.[Bi],
A Unified Method Based on Wavelet Transform and C-V Model for Crack Segmentation of 3D Industrial CT Images,
ICIG11(12-16).
IEEE DOI Link 1109
BibRef

Detchev, I.[Ivan], Habib, A.[Ayman], El-Badry, M.[Mamdouh],
Estimation Of Vertical Deflections In Concrete Beams Through Digital Close Range Photogrammetry,
Laser11(xx-yy).
PDF Version. 1109
BibRef

Hu, H.[Han], Gu, Q.Q.[Quan-Quan], Zhou, J.[Jie],
HTF: a novel feature for general crack detection,
ICIP10(1633-1636).
IEEE DOI Link 1009
BibRef

Oliveira, H.[Henrique], Caeiro, J.J.[Jose Jasnau], Correia, P.L.[Paulo Lobato],
Improved road crack detection based on one-class Parzen density estimation and entropy reduction,
ICIP10(2201-2204).
IEEE DOI Link 1009
BibRef

Hampel, U.,
Crack Detection In Load Tests For Civil Engineering Material Testing By Digital Closed Range Photogrammetry: Algorithms And Applications,
CloseRange10(xx-yy).
PDF Version. 1006
BibRef

Skarlatos, D., Bakolias, C.,
Industrial Inspection And Checking Of Marble Tiles,
CloseRange10(xx-yy).
PDF Version. 1006
BibRef

Aiger, D.[Dror], Talbot, H.[Hugues],
The phase only transform for unsupervised surface defect detection,
CVPR10(295-302).
IEEE DOI Link 1006
BibRef

Wang, X.S.[Xiao-Song], Mirmehdi, M.[Majid],
Archive Film Restoration Based on Spatiotemporal Random Walks,
ECCV10(V: 478-491).
Springer DOI Link 1009
BibRef
Earlier:
HMM based Archive Film Defect Detection with Spatial and Temporal Constraints,
BMVC09(xx-yy).
PDF Version. 0909
BibRef

Nakazawa, M.[Mitsuru], Aoki, Y.[Yoshimitsu], Kobayashi, M.[Masakazu], Toda, H.[Hiroyuki],
3D image analysis for evaluating internal deformation/fracture characteristics of materials,
ICPR08(1-4).
IEEE DOI Link 0812
BibRef

Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.],
Objective evaluation for segmentation of microscope images of materials,
Southwest10(137-140).
IEEE DOI Link 1005
BibRef

Chuang, H.C.A.[Hsiao-Chi-Ang], Comer, M.L.[Mary L.], Simmons, J.P.[Jeff P.],
Texture Classification in Microstructure Images of Advanced Materials,
Southwest08(1-4).
IEEE DOI Link 0803
BibRef

Tirronen, V.[Ville], Neri, F.[Ferrante], Karkkainen, T.[Tommi], Majava, K.[Kirsi], Rossi, T.[Tuomo],
A Memetic Differential Evolution in Filter Design for Defect Detection in Paper Production,
EvoIASP07(320-329).
Springer DOI Link 0704
BibRef

Haindl, M.[Michal], Grim, J.[Jirí], Mikeš, S.[Stanislav],
Texture Defect Detection,
CAIP07(987-994).
Springer DOI Link 0708
BibRef

d'Orazio, T., Leo, M., Guaragnella, C., Distante, A.,
Analysis of Image Sequences for Defect Detection in Composite Materials,
ACIVS07(855-864).
Springer DOI Link 0708
BibRef

Yue, K.[Kui], Huber, D.F.[Daniel F.], Akinci, B.[Burcu], Krishnamurti, R.[Ramesh],
The ASDMCon Project: The Challenge of Detecting Defects on Construction Sites,
3DPVT06(1048-1055).
IEEE DOI Link 0606
BibRef

Chowdhury, A.S., Bhattacharya, A., Bhandarkar, S.M., Datta, G.S., Yu, J.C., Figueroa, R.,
Hairline Fracture Detection using MRF and Gibbs Sampling,
WACV07(56-56).
IEEE DOI Link 0702
BibRef

Subirats, P., Dumoulin, J., Legeay, V., Barba, D.,
Automation of Pavement Surface Crack Detection using the Continuous Wavelet Transform,
ICIP06(3037-3040).
IEEE DOI Link 0610
BibRef

Urano, T., Kaneko, S., Tanaka, T.,
Robust registration of defect set by local consistency of point data,
IEVM06(xx-yy).
PDF Version. 0609
BibRef

Hansen, M.E.[Michael E.], Ersbøll, B.K.[Bjarne K.], Carstensen, J.M.[Jens M.], Nielsen, A.A.[Allan A.],
Estimation of Critical Parameters in Concrete Production Using Multispectral Vision Technology,
SCIA05(1228-1237).
Springer DOI Link 0506
BibRef

Frau, D.C.[David Cuesta], Hernández-Fenollosa, M.Á.[María Ángeles], Tormos, P.M.[Pau Micó], Linares-Pellicer, J.[Jordi],
Segmentation of Nanocolumnar Crystals from Microscopic Images,
ICIAR05(55-62).
Springer DOI Link 0509
BibRef

Limas Serafim, A.F.,
Segmentation of natural images based on multiresolution pyramids linking of the parameters of an autoregressive rotation invariant model. Application to leather defects detection,
ICPR92(III:41-44).
IEEE DOI Link 9208
BibRef

Vieira, S.M.[Susana M.], Sousa, J.M.C.[João M. C.], Pinto, J.R.C.[João R. Caldas],
Ant Based Fuzzy Modeling Applied to Marble Classification,
ICIAR06(II: 90-101).
Springer DOI Link 0610
See also Intelligent Real-Time Fabric Defect Detection. BibRef

Sousa, J.M.C.[João M.C.], Pinto, J.R.C.[João R. Caldas],
Comparison of Intelligent Classification Techniques Applied to Marble Classification,
ICIAR04(II: 802-809).
WWW Version. 0409
BibRef

Fujita, Y.[Yusuke], Mitani, Y.[Yoshihiro], Hamamoto, Y.[Yoshihiko],
A Method for Crack Detection on a Concrete Structure,
ICPR06(III: 901-904).
IEEE DOI Link 0609
BibRef

Amano, T.[Toshiyuki],
Correlation Based Image Defect Detection,
ICPR06(I: 163-166).
IEEE DOI Link 0609
BibRef

Sobral, J.L.,
Optimised Filters for Texture Defect Detection,
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