19.6.3.8 Inspection -- Defect Detection, Crack Detection

Avalon Vision Solutions,
1991.
WWW Version. Vendor, Inspection. Industrial inspection systems.

Ejiri, M., Uno, T., Mese, M., Ikeda, T.,
A Process for Detecting Defects in Complicated Patterns,
CGIP(2), 1973, pp. 326-339. BibRef 7300

Maitre, H.[Henri],
Defect recognition in numerical images by spectrum zero detection,
CGIP(5), No. 2, June 1976, pp. 238-244.
WWW Version. 0501 BibRef

Woods, P.W.[Peter W.], Allen, P.D.,
A cue generator for crack detection,
IVC(7), No. 4, November 1989, pp. 268-273.
WWW Version. 0401 BibRef

Gmytrasiewicz, P., Hassberger, J.A., Lee, J.C.,
Fault tree based diagnostics using fuzzy logic,
PAMI(12), No. 11, November 1990, pp. 1115-1119.
IEEE Abstract. IEEE Top Reference.
WWW Version. 0401 BibRef

Leu, J.G.[Jia-Guu], Yau, H.L.[Hok-Lai],
Detecting the dislocations in metal crystals from microscopic images,
PR(24), No. 1, 1991, pp. 41-56.
WWW Version. 0401 BibRef

Perner, P.[Petra],
A Knowledge-Based Image-Inspection System for Automatic Defect Recognition, Classification, and Process Diagnosis,
MVA(7), No. 3, 1994, pp. 135-147. BibRef 9400
Earlier:
Application of knowledge-based image inspection system for diagnosis of misprints in offsetprinting,
CAIP93(738-749).
WWW Version. 9309 BibRef

Bryson, N., Dixon, R.N., Hunter, J.J., Taylor, C.J.,
Contextual Classification of Cracks,
IVC(12), No. 3, April 1994, pp. 149-154.
WWW Version. BibRef 9404
Earlier: BMVC93(xx). BibRef

Azencott, R., Chalmond, B., Coldefy, F.,
Markov Fusion of a Pair of Noisy Images to Detect Intensity Valleys,
IJCV(16), No. 2, October 1995, pp. 135-145. Cracks. Task is to detect defects using pairs of radiographic images. Defects are identified as intensity valleys. BibRef 9510

Kona, S.R.[Sudheer R.], Foster, J.W.[Joseph W.], Varughese, J.V.[Joseph V.],
A robust algorithm for detecting pinholes in transparent plastic films,
PR(26), No. 8, August 1993, pp. 1215-1227.
WWW Version. 0401 BibRef

Nesi, P.[Paolo], Trucco, E.[Emanuel],
Guest Editorial: Special Issue on Real-Time Defect Detection,
RealTimeImg(5), No. 1, February 1999, pp. 1-2. BibRef 9902

Latif-Amet, A., Ertüzün, A., Erçil, A.,
An Efficient Method for Texture Defect Detection: Sub-Band Domain Co-Occurrence Matrices,
IVC(18), No. 6-7, 1 May 2000, pp. 543-553.
WWW Version. 0003 BibRef

Baykut, A.[Alper], Atalay, A.[Alper], Erçil, A.[Aytül], Güler, M.[Mustafa],
Real-time Defect Inspection of Textured Surfaces,
RealTimeImg(6), No. 1, February 2000, pp. 17-27. 0003 BibRef

Kazantsev, I.G., Lemahieu, I., Salov, G.I., Denys, R.,
Statistical detection of defects in radiographic images in nondestructive testing,
SP(82), No. 5, May 2002, pp. 791-801.
HTML Version. 0206 BibRef

Plantier, J.[Justin], Boutté, L.[Laurent], Lelandais, S.[Sylvie],
Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation,
JASP(2002), No. 7, July 2002, pp. 659-666. 0208 BibRef

Kumar, A., Pang, G.K.H.,
Defect detection in textured materials using optimized filters,
SMC-B(32), No. 5, October 2002, pp. 553-570.
IEEE Top Reference. 0210 BibRef

Tsai, D.M.[Du-Ming], Tsai, Y.H.[Ya-Hui],
Defect detection in textured surfaces using color ring-projection correlation,
MVA(13), No. 4, 2003, pp. 194-200.
HTML Version. 0304 BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta],
Fast normalized cross correlation for defect detection,
PRL(24), No. 15, November 2003, pp. 2625-2631.
WWW Version. 0308 BibRef

Tsai, D.M.[Du-Ming], Lin, C.T.[Chien-Ta], Chen, J.F.[Jeng-Fung],
The evaluation of normalized cross correlations for defect detection,
PRL(24), No. 15, November 2003, pp. 2525-2535.
WWW Version. 0308 BibRef

Tsai, D.M.[Du-Ming], Kuo, C.C.[Chih-Chia],
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction,
MVA(18), No. 6, December 2007, pp. 383-400.
WWW Version. 0711 BibRef

Lam, E.Y.[Edmund Y.],
Robust minimization of lighting variation for real-time defect detection,
RealTimeImg(10), No. 6, December 2004, pp. 365-370.
WWW Version. 0501 BibRef

Tsai, D.M.[Du-Ming], Chao, S.M.[Shin-Min],
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,
IVC(23), No. 3, 1 March 2005, pp. 325-338.
WWW Version. 0501 BibRef

Kalliomäki, I.[Ilkka], Vehtari, A.[Aki], Lampinen, J.[Jouko],
Shape analysis of concrete aggregates for statistical quality modeling,
MVA(16), No. 3, May 2005, pp. 197-201.
WWW Version. 0505 BibRef

Ribeiro, B.,
Support vector machines for quality monitoring in a plastic injection molding process,
SMC-C(35), No. 3, August 2005, pp. 401-410.
WWW Version. 0508 BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Takagi, Y.[Yuji], Okuda, H.[Hirohito],
Successive pattern classification based on test feature classifier and its application to defect image classification,
PR(38), No. 11, November 2005, pp. 1847-1856.
WWW Version. 0509 BibRef

Sakata, Y.[Yukinobu], Kaneko, S.[Shuni'chi], Tanaka, T.,
Successive pattern learning based on test feature classifier and its application to dynamic recognition problems,
IEVM06(xx-yy).
PDF Version. 0609 BibRef

Tsai, D.M.[Du-Ming], Yang, C.H.[Cheng-Hsiang],
A quantile-quantile plot based pattern matching for defect detection,
PRL(26), No. 13, 1 October 2005, pp. 1948-1962.
WWW Version. 0509 BibRef

Tsai, D.M.[Du-Ming], Yang, R.H.[Ron-Hwa],
An eigenvalue-based similarity measure and its application in defect detection,
IVC(23), No. 12, 1 November 2005, pp. 1094-1101.
WWW Version. 0510 BibRef

Liu, J.J.[J. Jay], MacGregor, J.F.[John F.],
Estimation and monitoring of product aesthetics: Application to manufacturing of 'engineered stone' countertops,
MVA(16), No. 6, 2006, pp. 374-383.
WWW Version. 0603 BibRef

Taniguchi, K.[Kazutaka], Ueta, K.[Kunio], Tatsumi, S.[Shoji],
A mura detection method,
PR(39), No. 6, June 2006, pp. 1044-1052.
WWW Version. 0604Mura (irregular lightness variation on a manufactured surface); Defect; Detection; Vision; Spatial frequency; Contrast enhancement BibRef

Tsai, D.M.[Du-Ming], Lin, P.C.[Ping-Chieh], Lu, C.J.[Chi-Jie],
An independent component analysis-based filter design for defect detection in low-contrast surface images,
PR(39), No. 9, September 2006, pp. 1679-1694.
WWW Version. 0606Surface inspection; Independent component analysis; Convolution filter; Particle swarm optimization BibRef

Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Chao, S.M.[Shin-Min], Yen, C.H.[Chao-Hsuan],
Independent component analysis based filter design for defect detection in low-contrast textured images,
ICPR06(II: 231-234).
WWW Version. 0609 BibRef

Lu, C.J.[Chi-Jie], Tsai, D.M.[Du-Ming],
Independent component analysis-based defect detection in patterned liquid crystal display surfaces,
IVC(26), No. 7, 2 July 2008, pp. 955-970.
WWW Version. 0804Defect detection; Surface inspection; TFT-LCD panels; Independent component analysis BibRef

Tsai, D.M.[Du-Ming], Lai, S.C.[Shia-Chih],
Defect detection in periodically patterned surfaces using independent component analysis,
PR(41), No. 9, September 2008, pp. 2812-2832.
WWW Version. 0806Defect detection; Patterned surface; Independent component analysis; Particle swarm optimization; Liquid crystal display BibRef

Baykal, I.C.[Ibrahim Cem], Jullien, G.A.[Graham A.],
On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures,
MVA(17), No. 3, August 2006, pp. 185-195.
WWW Version. 0606 BibRef

Ng, H.F.[Hui-Fuang],
Automatic thresholding for defect detection,
PRL(27), No. 14, 15 October 2006, pp. 1644-1649.
WWW Version. 0609Automatic thresholding; Defect detection BibRef

Sezer, O.G., Ercil, A., Ertuzun, A.,
Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection,
PR(40), No. 1, January 2007, pp. 121-133.
WWW Version. 0611Human vision; Texture defect detection; Independent component analysis; Receptive fields BibRef

Tsap, L.V.[Leonid V.], Duchaineau, M.[Mark], Goldgof, D.B.[Dmitry B.], Shin, M.C.[Min C.],
Data-driven feature modeling, recognition and analysis in a discovery of supersonic cracks in multimillion-atom simulations,
PR(40), No. 9, September 2007, pp. 2400-2407.
WWW Version. 0705Data-driven; Feature modeling (analysis, extraction, recognition); Image motion analysis; Physics-based; Supersonic cracks; Molecular dynamics; Atomic simulation; Nanoscale analysis BibRef

Caleb-Solly, P., Smith, J.E.,
Adaptive surface inspection via interactive evolution,
IVC(25), No. 7, 1 July 2007, pp. 1058-1072.
WWW Version. 0705Machine vision; Configuration; Interative; Evolution User knowledge to get description for defects. BibRef

Xie, X.H.[Xiang-Hua], Mirmehdi, M.[Majid],
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces,
PAMI(29), No. 8, August 2007, pp. 1454-1464.
WWW Version. 0707 BibRef
Earlier:
Localising Surface Defects in Random Colour Textures Using Multiscale Texem Analysis in Image Eigenchannels,
ICIP05(III: 1124-1127).
WWW Version. 0512Based on a few examples. Compare to Gabor filters. BibRef

Xie, X.H.[Xiang-Hua],
A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques,
ELCVIA(7), No. 3, 2008, pp. 1-22.
WWW Version. 0711 Survey, Defect Detection. BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming],
An anisotropic diffusion-based defect detection for low-contrast glass substrates,
IVC(26), No. 2, 1 February 2008, pp. 187-200.
WWW Version. 0711Defect detection; Surface inspection; Anisotropic diffusion; Low-contrast images; Glass substrates BibRef

Chao, S.M.[Shin-Min], Tsai, D.M.[Du-Ming], Tseng, Y.H.[Yan-Hsin], Jhang, Y.R.[Yuan-Ruei],
Defect detection in low-contrast glass substrates using anisotropic diffusion,
ICPR06(I: 654-657).
WWW Version. 0609 BibRef

Groby, J.P.[Jean-Philippe], Lesselier, D.[Dominique],
Localization and characterization of simple defects in finite-sized photonic crystals,
JOSA-A(25), No. 1, January 2008, pp. 146-152.
WWW Version. 0801 BibRef

Lim, M.S.[Mee-Seub], Lim, J.H.[Joon-Hong],
Visual measurement of pile movements for the foundation work using a high-speed line-scan camera,
PR(41), No. 6, June 2008, pp. 2025-2033.
WWW Version. 0802Line-scan image; Visual measurement; Pile movement BibRef

Tirronen, V.[Ville], Neri, F.[Ferrante], Karkkainen, T.[Tommi], Majava, K.[Kirsi], Rossi, T.[Tuomo],
A Memetic Differential Evolution in Filter Design for Defect Detection in Paper Production,
EvoIASP07(320-329).
WWW Version. 0704 BibRef

Haindl, M.[Michal], Grim, J.[Jirí], Mikeš, S.[Stanislav],
Texture Defect Detection,
CAIP07(987-994).
WWW Version. 0708 BibRef

d'Orazio, T., Leo, M., Guaragnella, C., Distante, A.,
Analysis of Image Sequences for Defect Detection in Composite Materials,
ACIVS07(855-864).
WWW Version. 0708 BibRef

Yue, K.[Kui], Huber, D.[Daniel], Akinci, B.[Burcu], Krishnamurti, R.[Ramesh],
The ASDMCon Project: The Challenge of Detecting Defects on Construction Sites,
3DPVT06(1048-1055).
WWW Version. 0606 BibRef

Chowdhury, A.S., Bhattacharya, A., Bhandarkar, S.M., Datta, G.S., Yu, J.C., Figueroa, R.,
Hairline Fracture Detection using MRF and Gibbs Sampling,
WACV07(56-56).
WWW Version. 0702 BibRef

Subirats, P., Dumoulin, J., Legeay, V., Barba, D.,
Automation of Pavement Surface Crack Detection using the Continuous Wavelet Transform,
ICIP06(3037-3040). 0610
WWW Version. BibRef

Urano, T., Kaneko, S., Tanaka, T.,
Robust registration of defect set by local consistency of point data,
IEVM06(xx-yy).
PDF Version. 0609 BibRef

Hansen, M.E.[Michael E.], Ersbřll, B.K.[Bjarne K.], Carstensen, J.M.[Jens M.], Nielsen, A.A.[Allan A.],
Estimation of Critical Parameters in Concrete Production Using Multispectral Vision Technology,
SCIA05(1228-1237).
WWW Version. 0506 BibRef

Frau, D.C.[David Cuesta], Hernández-Fenollosa, M.Á.[María Ángeles], Tormos, P.M.[Pau Micó], Linares-Pellicer, J.[Jordi],
Segmentation of Nanocolumnar Crystals from Microscopic Images,
ICIAR05(55-62).
WWW Version. 0509 BibRef

Limas Serafim, A.F.,
Segmentation of natural images based on multiresolution pyramids linking of the parameters of an autoregressive rotation invariant model. Application to leather defects detection,
ICPR92(III:41-44).
WWW Version. 9208 BibRef

Vieira, S.M.[Susana M.], Sousa, J.M.C.[Joăo M. C.], Pinto, J.R.C.[Joăo R. Caldas],
Ant Based Fuzzy Modeling Applied to Marble Classification,
ICIAR06(II: 90-101).
WWW Version. 0610 See also Intelligent Real-Time Fabric Defect Detection. BibRef

Sousa, J.M.C.[Joăo M.C.], Pinto, J.R.C.[Joăo R. Caldas],
Comparison of Intelligent Classification Techniques Applied to Marble Classification,
ICIAR04(II: 802-809).
WWW Version. 0409 BibRef

Fujita, Y.[Yusuke], Mitani, Y.[Yoshihiro], Hamamoto, Y.[Yoshihiko],
A Method for Crack Detection on a Concrete Structure,
ICPR06(III: 901-904).
WWW Version. 0609 BibRef

Amano, T.[Toshiyuki],
Correlation Based Image Defect Detection,
ICPR06(I: 163-166).
WWW Version. 0609 BibRef

Sobral, J.L.,
Optimised Filters for Texture Defect Detection,
ICIP05(III: 565-568).
WWW Version. 0512 BibRef

Bruno, R.[Roberto], Cuoghi, L.[Lorenza], Laurenge, P.[Pascal],
Quantitative Identification of Marbles Aesthetical Features,
IbPRIA05(II:674).
WWW Version. 0509 BibRef

Monadjemi, A., Mirmehdi, M., Thomas, B.T.,
Restructured Eigenfilter Matching for Novelty Detection in Random Textures,
BMVC04(xx-yy).
HTML Version. 0508 BibRef

Hou, Z.[Zhen], Parker, J.M.[Johné M.],
Texture Defect Detection Using Support Vector Machines with Adaptive Gabor Wavelet Features,
WACV05(I: 275-280).
WWW Version. 0502 BibRef

Viana, R.[Roberto], Rodrigues, R.B.[Ricardo B.], Alvarez, M.A.[Marco A.], Pistori, H.[Hemerson],
SVM with Stochastic Parameter Selection for Bovine Leather Defect Classification,
PSIVT07(600-612).
WWW Version. 0712 BibRef

Zhang, T.[Tong], Nagy, G.,
Surface tortuosity and its application to analyzing cracks in concrete,
ICPR04(II: 851-854).
WWW Version. 0409 BibRef

Ai, J.[Jiaoyan], Di, L.[Liu], Zhu, X.F.[Xue-Feng],
Combination of wavelet analysis and color applied to automatic color grading of ceramic tiles,
ICPR04(III: 235-238).
WWW Version. 0409 BibRef

Jia, H.B.[Hong-Bin], Murphey, Y.L.[Yi Lu], Shi, J.J.[Jian-Jun], Chang, T.S.[Tzyy-Shuh],
An intelligent real-time vision system for surface defect detection,
ICPR04(III: 239-242).
WWW Version. 0409 BibRef

Eisele, H., Hamprecht, F.A.,
A New Approach for Defect Detection in X-ray CT Images,
DAGM02(345 ff.).
HTML Version. 0303 BibRef

Toth, D., Condurache, A.P.[Alexandru Paul], Aach, T.[Til],
A two-stage-classifier for defect classification in optical media inspection,
ICPR02(IV: 373-376).
WWW Version. 0211 BibRef

Gupta, P., Doermann, D., DeMenthon, D.F.,
Beam search for feature selection in automatic SVM defect classification,
ICPR02(II: 212-215).
WWW Version. 0211 BibRef

Maalmi, K., El-Ouaazizi, A., Benslimane, R., Lew, L.F.C., Voon, Y.[Yan], Diou, A., Gorria, P.,
Crack defect detection and localization using genetic-based inverse voting Hough transform,
ICPR02(III: 257-260).
WWW Version. 0211 BibRef

Kumar, A., Shen, H.C.,
Texture inspection for defects using neural networks and support vector machines,
ICIP02(III: 353-356).
IEEE Abstract. IEEE Top Reference. 0210 BibRef

Nagy, G.[George], Zhang, T.[Tong], Franklin, W.R., Landis, E.[Eric], Nagy, E.[Edwin], Keane, D.T.[Denis T.],
Volume and Surface Area Distributions of Cracks in Concrete,
VF01(759 ff.).
HTML Version. 0209 BibRef

Martínez-Cabeza-de-Vaca-Alajarín, J.[Juan], Tomás-Balibrea, L.M.[Luis-Manuel],
Automatic Classification System of Marble Slabs in Production Line According to Texture and Color Using Artificial Neural Networks,
CAIP99(167-174).
WWW Version. 9909 BibRef

Chetverikov, D.[Dmitry], Khenokh, Y.[Yuri],
Matching for Shape Defect Detection,
CAIP99(367-374).
WWW Version. 9909 BibRef

Kobayashi, H.H., Hara, Y., Doi, H., Takai, K., Sumiya, A.,
Hybrid Defect Detection Method Based on Shape Measurement and Feature Extraction for Complex Patterns,
MVA98(xx-yy). BibRef 9800

Cho, S.H., Hisatomi, K., Hashimoto, S.,
Cracks and Displacement Feature Extraction of the Concrete Block Surface,
MVA98(xx-yy). BibRef 9800

Tanaka, N., Uematsu, K.,
A Crack Detection Method in Road Surface Images Using Morphology,
MVA98(xx-yy). BibRef 9800

Chetverikov, D.[Dmitry], Gede, K.[Krisztián],
Textures and structural defects,
CAIP97(167-174).
WWW Version. 9709 BibRef

Mari, M.[Massimo], Dambra, C.[Carlo], Chetverikov, D.[Dmitry], Verestoy, J.[Judit], Jozwik, A.[Adam], Nieniewski, M.[Mariusz], Chmielewski, L.[Leszek], Sklodowski, M.[Marek], Cudny, W.[Waldemar], Lugg, M.[Martin],
The CRASH project: Defect detection and classification in ferrite cores,
CIAP97(II: 781-787).
WWW Version. 9709 BibRef

Nieniewski, M.[Mariusz],
Morphological Method of Detection of Defects on the Surface of Ferrite Cores,
SCIA97(xx-yy) 9705
HTML Version. BibRef

Pakkanen, J.[Jussi], Ilvesmäki, A.[Antti], Iivarinen, J.[Jukka],
Defect Image Classification and Retrieval with MPEG-7 Descriptors,
SCIA03(349-355).
WWW Version. 0310 BibRef

Visa, A.[Ari], Iivarinen, J.[Jukka],
An Adaptive Texture and Shape Based Defect Classification,
ICPR98(Vol I: 117-122).
WWW Version. 9808 BibRef

Iivarinen, J.[Jukka], Rauhamaa, J.[Juhani], and Visa, A.[Ari],
An Adaptive Two-Stage Approach to Classification of Surface Defects,
SCIA97(xx-yy) 9705
HTML Version. BibRef

Delagnes, P., Barba, D.,
A Markov random field for rectilinear structure extraction in pavement distress image analysis,
ICIP95(I: 446-449).
WWW Version. 9510 BibRef

Anzalone, A., Machí, A.,
Visual detection of defects in moulded plastic drippers,
CAIP95(802-807).
WWW Version. 9509 BibRef

Bruzzone, L., Roli, F., Serpico, S.B.,
Crack detection by a measure of texture anisotropy,
CIAP95(743-747).
WWW Version. 9509 BibRef

Azencott, R., Yao, J.,
Automated detection of cowhide defects using Markov random field techniques,
ICPR94(A:791-793).
WWW Version. 9410 BibRef

Hepplewhite, L.[Lee], Stonham, T.J.[T. John],
Surface inspection using texture recognition,
ICPR94(A:589-591).
WWW Version. 9410 BibRef

Ojala, T., Pietikainen, M., Silven, O.,
Edge-based texture measures for surface inspection,
ICPR92(II:594-598).
WWW Version. 9208 BibRef

Silven, O., Westman, T., Huotari, S., Hakalahti, H.,
A Defect Analysis Method for Visual Inspection,
ICPR86(868-870). BibRef 8600

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection -- Paint and Printing Quality, Print Analysis .