19.6.4 Automated Measurement Systems

Flamholz, A.L., and Froot, H.A.,
Dimensional Measurement and Defect Detection Using Spatial Filtering,
IBMRD(17), No. 6, November 1973, pp. 509-518. BibRef 7311

Porter, III, G.B.,
An application of grey level image processing to an industrial dimensional inspection problem,
PR(14), No. 1-6, 1981, pp. 405-410.
WWW Version. 0309
BibRef

Groen, F.C.A., Verbeek, P.W., de Jong, N., Klumper, J.W.,
The smallest box around a package,
PR(14), No. 1-6, 1981, pp. 173-178.
WWW Version. 0309
Measures height and smallest rectangular hull of the vertical projection for parcels or suitcases on a conveyor belt. BibRef

Hall, E.L., Tio, J.B.K., McPherson, C.A., and Sadjadi, F.A.,
Measuring Curved Surfaces for Robot Vision,
Computer(15), No. 12, December 1982, pp. 42-54. BibRef 8212

Tio, J.B.K., McPherson, C.A., and Hall, E.L.,
Curved Surface Measurement for Robot Vision,
PRIP82(370-378). BibRef 8200

Haralick, R.M.,
Machine Vision Mensuration,
CVGIP(40), No. 3, December 1987, pp. 271-272.
WWW Version. Introduction to the special issue. BibRef 8712

Nishihara, H.K., and Crossley, P.A.,
Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions,
PAMI(10), No. 1, January 1988, pp. 17-30.
IEEE Abstract. IEEE Top Reference.
WWW Version. BibRef 8801

Gordon, S.J.[Steven J.], Seering, W.P.[Warren P.],
Real-Time Part Position Sensing,
PAMI(10), No. 3, May 1988, pp. 374-386.
IEEE Abstract. IEEE Top Reference.
WWW Version. BibRef 8805
And: MIT AI Memo-1032, May 1988. BibRef

Morris, D.T., Narendra-Nathan, A.,
A rule-based system for dimensional analysis of glass containers,
IVC(7), No. 4, November 1989, pp. 274-280.
WWW Version. 0401
BibRef

Wang, C.C.,
A Low-Cost Calibration Method for Automated Optical Mensuration Using A Video Camera,
MVA(7), No. 4, 1994, pp. 259-266. BibRef 9400

Clarke, T.A.,
An Analysis of the Prospects for Digital Close-Range Photogrammetry,
PandRS(50), No. 3, June 1995, pp. 4-7. BibRef 9506

Hsu, J.P., Fuh, C.S.,
Image Segmentation To Inspect 3-D Object Sizes,
OptEng(35), No. 1, January 1996, pp. 262-271. BibRef 9601

Beyer, H.A.,
Automated Dimensional Inspection With Real-time Photogrammetry,
PandRS(50), No. 3, June 1995, pp. 20-26. BibRef 9506

Axelsson, P.,
ISPRS Commission-III Symposium: Spatial Information from Digital Photogrammetry and Computer Vision,
PandRS(50), No. 2, April 1995, pp. 45-46. Meeting of September 5-9, 1994, Munich, Germany. BibRef 9504

Salvi, J., Batlle, J., Mouaddib, E.,
A Robust-Coded Pattern Projection for Dynamic 3D Scene Measurement,
PRL(19), No. 11, September 1998, pp. 1055-1065. 9811
BibRef

Edmundson, K.L.[Kenneth L.], Fraser, C.S.[Clive S.],
A practical evaluation of sequential estimation for vision metrology,
PandRS(53), No. 5, October 1998, pp. 272-285. BibRef 9810

Fraser, C.S.[Clive S.], Edmundson, K.L.[Kenneth L.],
Design and implementation of a computational processing system for off-line digital close-range photogrammetry,
PandRS(55), No. 2, June 2000, pp. 94-104. 0008
BibRef

Lin, C.F.[Chi-Fang], Lin, C.Y.[Chih-Yang],
A new approach to high precision 3-D measuring system,
IVC(17), No. 11, September 1999, pp. 805-814.
WWW Version. BibRef 9909

Tillett, R.[Robin], McFarlane, N.[Nigel], Lines, J.[Jeff],
Estimating Dimensions of Free-Swimming Fish Using 3D Point Distribution Models,
CVIU(79), No. 1, July 2000, pp. 123-141. 0006

WWW Version. BibRef

Criminisi, A., Reid, I.D., Zisserman, A.,
Single View Metrology,
IJCV(40), No. 2, November 2000, pp. 123-148.
WWW Version. 0101
BibRef
Earlier: ICCV99(434-441).
IEEE DOI Link BibRef

Criminisi, A.,
Single-View Metrology: Algorithms and Applications,
DAGM02(224 ff.).
HTML Version. 0303
BibRef

Coakley, K.J.[Kevin J.], Levenson, M.S.[Mark S.],
Guest editorial: Advances in quantitative image analysis,
IJIST(11), No. 4, 2001, pp. 209. 0105
BibRef

Hattori, S.[Susumu], Akimoto, K.[Keiichi], Fraser, C.S.[Clive S.], Imoto, H.[Harutaka],
Automated Procedures with Coded Targets in Industrial Vision Metrology,
PhEngRS(68), No. 5, May 2002, pp. 441-446. Automated processing to reduce data processing time by as much as 93 percent.
WWW Version. 0206
BibRef

Chong, A.K.,
A Rigorous Technique for Forensic Measurement of Surveillance Video Footage,
PhEngRS(68), No. 7, July 2002, pp. 753. Using a singly-view video frame to make accurate measurements.
WWW Version. 0207
BibRef

Rivero, D., Paindavoine, M., Petit, S.,
Real-time Sub-pixel Cross Bar Position Metrology,
RealTimeImg(8), No. 2, April 2002, pp. 105-113.
WWW Version. 0208
Measure cross-bar positions. BibRef

Montillo, A.A.[Albert A.], Bachelder, I.A.[Ivan A.], Marrion, Jr., C.C.[Cyril C.],
Methods and apparatuses for measuring an extent of a group of objects within an image,
US_Patent6,571,006, May 27, 2003
WWW Version. BibRef 0305

Malassiotis, S.[Sotiris], Strintzis, M.G.[Michael G.],
Stereo vision system for precision dimensional inspection of 3D holes,
MVA(15), No. 2, December 2003, pp. 101-113.
Springer DOI Link 0401
BibRef

Chang, C.I., Ren, H., Chang, C.C., d'Amico, F., Jensen, J.O.,
Estimation of Subpixel Target Size for Remotely Sensed Imagery,
GeoRS(42), No. 6, June 2004, pp. 1309-1320.
IEEE Abstract. IEEE Top Reference. 0407
BibRef

Salas, J.[Joaquín], Avalos, W.[Wendy], Castañeda, R.[Rafael], Maya, M.[Mario],
A machine-vision system to measure the parameters describing the performance of a Foucault pendulum,
MVA(17), No. 2, May 2006, pp. 133-138.
Springer DOI Link 0605
BibRef

Bigand, A., Evrard, L., Dubus, J.P.,
A new perceptual organization approach to 3D measuring system based on the fuzzy integral,
IVC(24), No. 4, 1 April 2006, pp. 381-393.
WWW Version. Computer vision; Perceptual organization; Fuzzy integral 0606
BibRef

Chen, Z.Z.[Ze-Zhi], Pears, N.[Nick], Liang, B.J.[Bo-Jian],
A method of visual metrology from uncalibrated images,
PRL(27), No. 13, 1 October 2006, pp. 1447-1456.
WWW Version. 0606
BibRef
Earlier: A3, A1, A2:
Uncalibrated two-view metrology,
ICPR04(I: 96-99).
IEEE DOI Link 0409
Reciprocal-polar (RP) transform; Homography matrix; Fundamental matrix; Metrology; Focus of expansion (FOE); Uncalibrated image BibRef

Zeng, H.[Hui], Deng, X.M.[Xiao-Ming], Hu, Z.Y.[Zhan-Yi],
A new normalized method on line-based homography estimation,
PRL(29), No. 9, 1 July 2008, pp. 1236-1244.
WWW Version. 0711
Point-based homography estimation; Line-based homography estimation; Visual metrology; Data normalization BibRef

Bouridane, A.[Ahmed],
Imaging for Forensics and Security: From Theory to Practice,
Springer2009, ISBN: 978-0-387-09531-8
WWW Version. To purchase this book look here 0909
BibRef

Deng, X.M.[Xiao-Ming], Wu, F.C.[Fu-Chao], Wu, Y.H.[Yi-Hong], Duan, F.Q.[Fu-Qing],
Visual metrology with uncalibrated radial distorted images,
ICPR08(1-4).
IEEE DOI Link 0812
BibRef

Duran, Z., Aydar, U.,
Measurement and 3D Modelling of an Ancient Measuring Device: Nippur Cubit Rod,
ISPRS08(B5: 265 ff).
PDF Version. 0807
BibRef

Yanagi, H.[Hideharu], Honma, Y.[Yuichi], Chikatsu, H.[Hirofumi],
Performance Evaluations of Macro Lens for Digital Documentation of Small Objects,
ISPRS08(B5: 159 ff).
PDF Version. 0807
BibRef

Ji, Z.[Zheng], Wu, Y.[Yuan], Sheng, Q.[QingHong],
Automatic Reconstruction for Small Archeology Based on Close-Range Photogrammetry,
ISPRS08(B5: 165 ff).
PDF Version. 0807
BibRef

Yu, Q.F.[Qi-Feng], Jiang, G.W.[Guang-Wen], Fu, S.H.[Si-Hua], Shang, Y.[Yang], Liang, Y.H.[Yong-Hui], Li, L.C.[Li-Chun],
Broken-Ray Videometric Method and System for Measuring the Three-Dimensional Position and Pose of the Non-Intervisible Object,
ISPRS08(B5: 145 ff).
PDF Version. 0807
BibRef

Zheng, S.Y.[Shun-Yi], Wang, R.R.[Rui-Rui], Chen, C.J.[Chang-Jun], Zhang, Z.X.[Zu-Xun],
3D Measurement and Modeling Based on Stereo-Camera,
ISPRS08(B5: 57 ff).
PDF Version. 0807
BibRef

Zheng, L.[Li], Zhang, J.Q.[Jiang-Qing], Luo, Y.J.[Yue-Jun],
Acquiring Initial Value of Multi-View Metrical Data Integration,
ISPRS08(B3b: 741 ff).
PDF Version. 0807
BibRef

Mendonca, P.R.S.[Paulo R. S.], Kaucic, R.[Robert],
Single View Metrology: A Practical Example,
WACV08(1-8).
IEEE DOI Link 0801
BibRef

Ravindran, P., Ferrier, N.J., Park, S.M., Nealey, P.F.,
Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures,
ICIP07(IV: 329-332).
IEEE DOI Link 0709
BibRef

Jiang, Z.D.[Zhong-Ding], Jiang, N.[Nan], Wang, Y.J.[Yi-Jie], Zang, B.Y.[Bin-Yu],
Distance Measurement in Panorama,
ICIP07(VI: 393-396).
IEEE DOI Link 0709
BibRef

Biskup, K., Arias, P., Lorenzo, H., Armesto, J.,
Application of Terrestrial Laser Scanning for Shipbuilding,
Laser07(56).
PDF Version. 0709
BibRef

Fernandes, L.A.F.[Leandro A.F.], Oliveira, M.M.[Manuel M.],
A scanner for computing box dimensions in real time,
SigGraph06(Article 128).
WWW Version. From perspective projection. BibRef 0600

Koh, T.K.[Tze Ki], Miles, N.[Nicholas], Morgan, S.[Steve], Hayes-Gill, B.[Barrie],
Image Segmentation of Overlapping Particles in Automatic Size Analysis Using Multi-Flash Imaging,
WACV07(47-47).
IEEE DOI Link 0702
BibRef

Cheng, S., Luo, X., Bhandarkar, S.M., Fan, J., Zhao, Y.,
Video-based Metrology of Water Droplet Spreading on Nanostructured Surfaces,
WACV07(16-16).
IEEE DOI Link 0702
BibRef

Reiterer, A.,
A semi-automatic image-based measurement system,
IEVM06(xx-yy).
PDF Version. 0609
BibRef

Wang, W.X.[Wei-Xing],
Online Aggregate Particle Size Measurement on A Conveyor Belt,
ICPR06(III: 1032-1035).
WWW Version. 0609
BibRef

Yachide, Y., Oike, Y., Ikeda, M., Asada, K.,
Real-Time 3-D Measurement System Based on Light-Section Method Using Smart Image Sensor,
ICIP05(III: 1008-1011).
IEEE DOI Link 0512
BibRef

Rudin, L., Monasse, P., Yu, P.[Ping],
Epipolar Photogrammetry: A novel method for forensic image comparison and measurement,
ICIP05(III: 385-388).
IEEE DOI Link 0512
BibRef

Cao, X., Foroosh, H.,
Metrology from Vertical Objects,
BMVC04(xx-yy).
HTML Version. 0508
BibRef

Tsui, P.T.[Ping Tim], Tsui, H.T.[Hung Tung], Cham, W.K.[Wai Kuen],
Metric measurement on arbitrary planes in 2 images using the conformal point,
ICPR04(I: 108-111).
IEEE DOI Link 0409
BibRef

Wang, G.H.[Guang-Hui], Wu, Y.H.[Yi-Hong], Hu, Z.Y.[Zhan-Yi],
A novel approach for single view based plane metrology,
ICPR02(II: 556-559).
IEEE DOI Link 0211
BibRef

Hoffman, D.D.[Donald D.],
Mereology of Visual Form,
VF01(40 ff.).
HTML Version. 0209
BibRef

Shiranita, K., Hayashi, K., Otsubo, A., Takiyama, R.,
Shape Measurement and Sketching Systems for Porcelain Using Image Technology,
ICPR00(Vol IV: 795-798).
IEEE DOI Link
HTML Version. 0009
BibRef

Brenner, C.[Claus], Boehm, J.[Jan], Goehring, J.[Jens],
An Experimentical Measurement System for Industrial Inspection of 3D Parts,
SPIE(3521), 1998, pp. 237-247. industrial inspection, range images, object recognition, CAD. BibRef 9800

Saitoh, N.[Naoki], Kurosawa, K.[Kenji], Kuroki, K.[Kenro],
A Study on Height Measurement from a Single View,
ICIP99(III:523-526).
IEEE Abstract. IEEE Top Reference. BibRef 9900

Gajdamowicz, K.,
Determination of the Accuracy of Automated Measurements Performed on Georeferenced Images Acquired by Mobile Mapping System,
ISPRSGIS99(35-40). BibRef 9900

Lilienblum, T., Albrecht, P., Michaelis, B.,
3D-Measurement of Geometrical Shapes by Photogrammetry and Neural Networks,
ICPR96(IV: 330-334).
IEEE DOI Link 9608
(Otto-von-Guericke Univ., D) BibRef

Pandit, S.M., Guo, R.,
Shape mensuration and recognition by DDS approach,
ICIP95(III: 49-52).
IEEE DOI Link 9510
BibRef

Modayur, B.R., Shapiro, L.G., and Haralick, R.M.,
Visual Inspection of Machined Parts,
CVPR92(393-398).
IEEE Abstract. IEEE Top Reference. Inspection by measurement. BibRef 9200

Robinson, M.J., Oakley, J.P.,
Measuring Geometrical Parameters of Involute Spur Gears to Sub-pixel Resolution,
BMVC92(xx-yy).
PDF Version. 9209
BibRef

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Recognition Systems Applied to Specific Applications .