Pauwels, E.J.,
Moons, T.,
Van Gool, L.J.,
Kempenaers, P.,
Oosterlinck, A.,
Recognition Of Planar Shapes Under Affine Distortion,
IJCV(14), No. 1, January 1995, pp. 49-65.
Springer DOI Link See also Foundations Of Semi-Differential Invariants.
BibRef
9501
Van Gool, L.J.,
Moons, T.,
Ungureanu, D.,
Oosterlinck, A.,
The Characterization and Detection of Skewed Symmetry,
CVIU(61), No. 1, January 1995, pp. 138-150.
WWW Version.
BibRef
9501
Kempenaers, P.,
Van Gool, L.J., and
Oosterlinck, A.,
Shape Recognition under Affine Distortions,
VF91(323-332).
Matching, Invariants.
BibRef
9100
Wagemans, J.[Johan],
Detection of visual symmetries,
SV(9), No. 9, 1995, pp. xx-yy.
BibRef
9500
Van Gool, L.J.,
Wagemans, J.,
Vandeneede, J.,
Oosterlinck, A.,
Similarity Extraction and Modelling,
ICCV90(530-534).
IEEE DOI Link
BibRef
9000
Adler, S.L.,
Krishnan, R.,
Similarity and Affine Normalization of Partially Occluded Planar Curves
Using First and 2nd Derivatives,
PR(31), No. 10, October 1998, pp. 1551-1556.
WWW Version.
9808
BibRef
Heikkila, J.,
Statistical method for object alignment under affine transformation,
CIAP03(360-365).
IEEE Abstract. IEEE Top Reference.
0310
BibRef
Frydrychowicz, S.,
A New Approach to Affine Transform Invariant Shape Matching,
VF91(267-274).
Decompose the shape into sections and
match the sections of the contour (lobes, etc.).
BibRef
9112
Hummel, R.A., and
Wolfson, H.J.,
Affine Invariant Matching,
DARPA88(351-364).
BibRef
8800
Bachelder, I.A.[Ivan A.], and
Ullman, S.,
Contour Matching Using Local Affine Transformations,
CVPR92(798-801).
IEEE Abstract. IEEE Top Reference.
BibRef
9200
And:
DARPA92(299-310).
BibRef
And: A1 only:
MIT AI Memo-1326, April 1992.
Computes a point to point contour match.
WWW Version.
BibRef
Baird, H.S.,
Model-Based Image Matching Using Location,
Cambridge:
MIT Press1985.
Matching features to convex regions leads to linear constraints of the
set of possible transformations.
BibRef
8500
Chapter on Registration, Matching and Recognition Using Points, Lines, Regions, Areas, Surfaces continues in
Region/Contour Matching, Accumulation Based .